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Xavier Turrillas, He holds a degree in Chemistry and another in Pharmacy, a PhD in Materials Science (University of Grenoble, 1984) and a PhD in Chemistry (University of Navarre, 1986). Postdoctoral Researcher at the University of London (Imperial College and Birkbeck College) from 1986 to 1996. Senior Scientist at the Spanish High Council for Scientific Research since 1996, first at Eduardo Torroja Institute for Construction Sciences and from 2014 at both the Institute of Materials Science of Barcelona and the ALBA Synchrotron Facility. His main research interests hinge upon the use of neutron and synchrotron X-ray diffraction methods to study time resolved processes in Materials Science.

High energy X-ray diffraction to probe the structure of nanocrystalline materials

Xavier Turrillas

Institut de Ciència de Materials de Barcelona (ICMAB) – Spanish High Council for Scientific Research (CSIC)

Abstract
Very soon, with the advent of a state of the art synchrotron source in Brazil a horizon of new prospects is going to emerge. Among the many possible outcomes a high energy beamline capable of delivering monochromatic radiation between 30 to 120 keV is already scheduled. This facility will allow capturing diffraction data with large Q-ranges adequate to do Pair Distribution Function Analysis (PDF) and the subsequent determination of atomic distribution in the short range domain. Traditionally this approach has been used to study glasses and amorphous materials, but with the growing interest in nanostructured materials PDF has acquired a sudden relevance, since from a diffraction pattern both long and short range structures can be extracted. A brief introduction to the basic principles of this PDF method and some examples of applications focused on nano and crystalline materials of technological interest will be discussed.