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Mark Baker, is a Reader in Surface Science and Engineering and a member of the Engineering Materials Research Centre in the Department of Mechanical Engineering Sciences, University of Surrey. He was appointed as a Lecturer in the Department in 1999 and previsly worked at EU Institute of Advanced Materials, Ispra, Italy and GEC Hirst Research Centre, London. His principal research interests are materials characterisation using XPS, AES, SEM, TEM, XRD, AFM, FIB in application areas such as inorganic thin films, coatings and corrosion.

XPS analysis and depth profiling of metal oxide thin films using an Ar cluster source

Mark Baker

Department of Mechanical Engineering Sciences, University of Surrey, Guildford, Surrey, GU2 7XH, UK

Abstract
Dr. Baker is a Reader in Surface Science and Engineering and a member of the Engineering Materials Research Centre in the Department of Mechanical Engineering Sciences, University of Surrey. He was appointed as a Lecturer in the Department in 1999 and previsly worked at EU Institute of Advanced Materials, Ispra, Italy and GEC Hirst Research Centre, London. His principal research interests are materials characterisation using XPS, AES, SEM, TEM, XRD, AFM, FIB in application areas such as inorganic thin films, coatings and corrosion.